Boundary Scan, also known as JTAG, is a test technique that is applied to devices equipped with a special Test Access Port (TAP) and additional circuitry. Conforming to the IEEE 1149.1 standard, these devices can be tested both internally and externally using serial data conforming to the standard.

  • In-Circuit techniques isolate the Cluster
  • Functional techniques test and diagnose within the Cluster

We have products that can use either of these techniques, or a combination of them, as required in a circuit, allowing the programmer to perform the best no-compromise method of testing within any commercial constraints that may be imposed.

Without using a safe back driving technique, testing a board can introduce new failures. Diagnosys products eliminate this problem by using a pulse technique that fully complies with recommended guidelines for the safe testing of devices.

FaLang translation system by Faboba