• In-Circuit techniques isolate the Cluster
  • Functional techniques test and diagnose within the Cluster

We have products that can use either of these techniques, or a combination of them, as required in a circuit, allowing the programmer to perform the best no-compromise method of testing within any commercial constraints that may be imposed.

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Diagnosys' products with Cluster Testing Capability

S790

The Diagnosys S790 Series2 with its high technical specification hardware and technology, represents the ultimate high-performance, precision test ATE system.

S500+DSS

The S500-DSS provides a combined LRU functional test and PCB diagnostic capability in a single platform

PinPoint II R

The PinPoint II R provides industry leading capability for the test and fault finding of the most challenging circuits. Allowing you to select and apply different test techniques on a single circuit, comprehensive fault coverage is ensured.