Test Adaptors

Robust in-circuit test access for standard and custom ICs.

Key benefits

• Device Test Interface (DTI) The Diagnosys DTI range is purposely designed for use in demanding test environments. They provide the physical electrical interface between the pin electronics of the test system and the device being tested. These interfaces are constructed from a special material that is precision milled and drilled, delivering a hardwearing finish that will provide years of use.
• IC test and development adaptors for DIP, PLCC & PGA devices The out-of-circuit test adaptors are designed to work with the PinPoint range of test systems. They are robust and flexible units allowing you to program, test, identify and compare devices. The adaptors can also be used to detect counterfeit devices.
• Universal test adaptors for Small Outline IC devices The P2-500-SOIC is a universal adaptor for testing SOICs (Small Outline Integrated Circuits) out-of-circuits. Designed for use with the PinPoint range of test systems and the P2-500-DIL test box, the adaptor allows you to verify the functionality of SOIC devices or to develop new test routines without interference from associated circuitry when they are fitted in a circuit. The SOIC Test adaptor uses a 44-pin Universal SOIC Test Socket and can therefore accommodate any SOIC device (both wide and narrow bodies) from 8 pins up to 44 pins, which is the largest SOIC device body available on the market.

DTI Accessories List

Search and filter the accessory list below. Use the PDF/PCF links to download files.