• Up to 384 dynamic Universal test channels
• Up to 256 Digital test channels
• 5MHz, 10MHz, 15MHz or 25MHz digital test rate options

PinPoint Sigma is a compact and transportable system. It provides excellent fault screening, test and diagnostic capability where and when needed. The modular architecture allows you to have a fully configured system in the base workshop, or depot repair center, and a PinPoint Sigma or PinPoint Alpha with sub-set of the configuration used to test specific PCBs in other locations.

The standard PinPoint Sigma provides 32 universal test channels with switching matrix, 4 1/2 digit DMM, analog signatures, UUT power supplies, tutorial, manual, accessory pack and standard TestVue license. With an integrated PC the system is ready to use out-of-the-box.

Fast test pattern rates up to 25MHz help ensure that digital devices are functionally tested thoroughly so that more faults can be detected and accurately identified

Digital in-circuit tests on the PinPoint series are designed to be completed within 20 milli-seconds to help ensure the safety of the circuits you are testing. A programmable hardware timer removes the test stimulus at the end of the period so that ICs are protected from extended backdrive currents.

In addition to the digital testing capability, vectorless test methods can be used to check each network for open circuits, shorts circuits, resistive, capacitive and inductive faults as well as testing semiconductor junctions.

Providing affordable quality that reliably finds PCB faults, PinPoint Alpha and Sigma are compact and transportable systems. They provide excellent PCB fault screening, PCB test and fault diagnostic capability where and when needed.

The standard PinPoint Alpha provides 32 universal test channels with switching matrix, 4 1/2 digit DMM, analog signatures, UUT power supplies, tutorial, manual, accessory pack and standard TestVue license. With an integrated PC the system is ready to use out-of-the-box.

• Functional testing from the edge connector
• Functional testing of a single component and digital IC
• Boundary scan at a device level and through a chain
• Passive and active device analog testing
• Mixed-signal functional test
• Vectorless test
• Analog impedance signatures
• PCB parameter testing