In addition to the active and dynamic testing available using in-circuit and functional testing, our products have a powerful Voltage / Current (V/I) nodal analysis technique available.

This is a power-off technique that can be applied to any circuit without any knowledge of its function or design. The technique basically compares a learnt signature from a known good board (stored in the test database) with a signature measured from the board under test.

Automatic selection of voltage and frequency to provide a stable and repeatable signature makes the programming task easy and fast. Our TestVue software also stores alternative signatures for each circuit network to avoid false failures should a device from a different manufacturer (same function but different characteristics) be encountered.